dc.contributor.author |
Chandralal, L. |
|
dc.contributor.author |
Valenzuela, F.R. |
|
dc.date.accessioned |
2017-11-08T04:20:07Z |
|
dc.date.available |
2017-11-08T04:20:07Z |
|
dc.date.issued |
2015 |
|
dc.identifier.citation |
Chandralal, L., Valenzuela, F.R. (2015). "Memorable Tourism Experiences; Scale Development", Contemporary Management Research, Vol.11 (3), pp. 291-310 |
en_US, si_LK |
dc.identifier.uri |
http://dr.lib.sjp.ac.lk/handle/123456789/6662 |
|
dc.description.abstract |
Attached |
en_US, si_LK |
dc.description.abstract |
This paper presents the findings of a research intended to develop a reliable and
valid measurement instrument for memorable tourism experiences from the
perspectives of more regular and typical leisure-oriented travellers. The exploratory;
stage involved data analysis 6f 100 travel blog narratives and 35 in-depth interviews;
and the subsequent quantitative stage gathered data through a survey of 700;
respondents who had visited some of the major tourist sites in Australia. The study
confirmed a reliable and valid MTE instrument having 34 items across the tern
experiential dimensions: authentic local experiences; novel experiences; selfbeneficial experiences; significant travel experiences; serendipitous and surprising
experiences; local hospitality; social interactions; impressive local guides and tour [
operators; fulfilment of personal travel interests and affective emotions. However, the \
relative importance of these dimensions can differ according to the destinations and •
travellers’ demographic characteristics. The results provide important managerial
implications for destination marketing efforts. |
|
dc.language.iso |
en_US |
en_US, si_LK |
dc.publisher |
Contemporary Management Research |
en_US, si_LK |
dc.subject |
Memorable Tourism Experiences (MTEs) |
en_US, si_LK |
dc.subject |
Tourist Experience |
en_US, si_LK |
dc.subject |
Instrument Development |
en_US, si_LK |
dc.title |
Memorable Tourism Experiences; Scale Development |
en_US, si_LK |
dc.type |
Article |
en_US, si_LK |